New product introductions : are current testing techniques to blame for their high failure rate?
Title
New product introductions : are current testing techniques to blame for their high failure rate?
Date
1985
Publisher
New York Institute of Technology
Subject
New products--Testing.
Language
English
Format
PDF
Type
Text
Identifier
https://repository.nyitlibrary.org/files/original/5e99f53e15f292d5d4ec46bab90afbad.pdf
Files
Citation
Zoref, Caryl N., New product introductions : are current testing techniques to blame for their high failure rate?. New York Tech Institutional Repository, accessed October 10, 2026, https://repository.nyitlibrary.org/items/show/1529
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